Opens Testing Products voor ICT Test Fixtures.

Since some time already, US companies originally had developed vectorless test techniques for detecting open pins on component packages and connectors. HP / Agilent developed TestJet and VTEP Parts, Genrad OpenXpress and Teradyne Framescan plus and FX2.0.
In addition to these developments ECT developed their Hanger probes.
The compliant motion of the ECT Hanger probes is perfect for use with non level or non parallel applications. By lessening the side forces, there is less opportunity for damage to the sensors under test.

Conventional probes cause stress interference due to non- compliance in the sensor probe combination.

ECT Spring loaded hanger style probes offer compliance during gate opening and closing guaranteeing stress free operation.

Below you find an overview of the available parts, klick the picture to enlarge it.

Testjet & Vtep Parts for Agilent 307X ICT test systems.
Genrad OpensXpress and Opens parts for Genrad and Digital test testers.
Teradyne FrameScan plus en FrameScan FX 2.0 parts for Teradyne test systems.
LED Analog and Digital Color and Intensity Analyzers.
Board Marker Probes to scratch an O from OKAY tested in the PCB’s solder mask layer.
Personality pins for the Agilent 307X testers and reference probes.
Special Long Hanger Probes for Vtep & testjet probes and Fiber optic parts for Digital and Analog LEDCheck systems.